Department Publications

With the advancement of technology, the digital Integrated Circuit (IC) design process has become more complex and denser. Hence, the IC testing procedure requires high-end test equipment to validate the accuracy and reliability of the manufactured components. Testers with such capabilities usually cost millions of dollars. In this paper, the authors have presented a low-cost hardware and software solution for digital IC testing. Digital ICs which operate under the 100MHz range can be easily tested in the digital domain with the FPGA-based test environment. The presented design comprises of a scalable architecture with a set of clock synchronized Altera DE0-Nano Field Programmable Gate Arrays (FPGAs) which handles the digital testing of Device Under Test (DUT) at a low cost. The digital test patterns are generated inside a computer, which transfers them to the FPGA environment and feeds them to DUT. The …